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1

Football et psychose

F. Nolot, C. Védie

Journal:

Annales Médico-psychologiques, revue psychiatrique

Year:

2008

Language:

french

File:

PDF, 158 KB

french, 2008

2

Organisation, méthodes et recherches en archéologie criminalistique à l’Institut de recherche criminelle de la gendarmerie nationale. À propos de 20ans d’expérience

Ducrettet, F., Georges, P., Nolot, F., Richebé, J., Schuliar, Y.

Journal:

La Revue de Médecine Légale

Year:

2013

Language:

french

File:

PDF, 2.75 MB

french, 2013

3

[IEEE 2015 IEEE 29th International Conference on Advanced Information Networking and Applications Workshops (WAINA) - Gwangiu, South Korea (2015.3.24-2015.3.27)] 2015 IEEE 29th International Conference on Advanced Information Networking and Applications Workshops - SDN Based Architecture for IoT and Improvement of the Security

Flauzac, Olivier, Gonzalez, Carlos, Hachani, Abdelhak, Nolot, Florent

Year:

2015

Language:

english

File:

PDF, 375 KB

english, 2015

4

Men Versus Chess Microcomputers in Paris

Journal:

Year:

1982

File:

PDF, 547 KB

1982

5

Systematic combination of X-ray reflectometry and spectroscopic ellipsometry: A powerful technique for reliable in-fab metrology

E. Nolot, A. André

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 590 KB

english, 2011

6

Fully depleted silicon on insulator MOSFETs on (1 1 0) surface for hybrid orientation technologies

T. Signamarcheix, F. Andrieu, B. Biasse, M. Cassé, A.-M. Papon, E. Nolot, B. Ghyselen, O. Faynot, L. Clavelier

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 667 KB

english, 2011

7

Optical metrology of thick photoresist process for advanced 3D applications

Nolot, E., André, A., Scibetta, C., Poulingue, M., Levin, L., Vignoud, L., Isselé, H.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 977 KB

english, 2014

8

Sobolev estimates for optimal transport maps on Gaussian spaces

Fang, Shizan, Nolot, Vincent

Journal:

Journal of Functional Analysis

Year:

2014

Language:

english

File:

PDF, 456 KB

english, 2014

9

[IEEE Comput. Soc 14th International Parallel and Distributed Processing Symposium. IPDPS 2000 - Cancun, Mexico (1-5 May 2000)] Proceedings 14th International Parallel and Distributed Processing Symposium. IPDPS 2000 - Limits and power of the simplest uniform and self-stabilizing phase clock algorithm

Nolot, F., Villain, V.

Year:

2000

Language:

english

File:

PDF, 164 KB

english, 2000

10

Cover crops mitigate nitrate leaching in cropping systems including grain legumes: Field evidence and model simulations

Plaza-Bonilla, Daniel, Nolot, Jean-Marie, Raffaillac, Didier, Justes, Eric

Journal:

Agriculture, Ecosystems & Environment

Year:

2015

Language:

english

File:

PDF, 1.95 MB

english, 2015

11

[AIP CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology - Gaithersburg, MD (27-29 March 2007)] AIP Conference Proceedings - Laser Scattering: a Fast, Sensitive, In-Line Technique for Advanced Process Development and Monitoring

Nolot, E., Arrazat, B., Favier, S., Borde, Y., Damlencourt, J. F., Vincent, B., Kermarrec, O., Carron, V., Nemouchi, F., Vandelle, P., Bogumilowicz, Y., Danel, A., Seiler, David G., Diebold, Alain C.,

Year:

2007

File:

PDF, 5.89 MB

2007

12

Sub-Riemannian geometry and swimming at low Reynolds number: the Copepod case

Bettiol, P., Bonnard, B., Nolot, A., Rouot, J.

Journal:

ESAIM Control Optimisation and Calculus of Variations

Year:

2019

File:

PDF, 1.35 MB

2019

13

[IEEE GLOBECOM 2019 - 2019 IEEE Global Communications Conference - Waikoloa, HI, USA (2019.12.9-2019.12.13)] 2019 IEEE Global Communications Conference (GLOBECOM) - Is Mininet the Right Solution for an SDN Testbed?

Flauzac, Olivier, Gallegos Robledo, Erick Mauricio, Nolot, Florent

Year:

2019

File:

PDF, 4.27 MB

2019

14

A review of native container security for running applications

Flauzac, Olivier, Mauhourat, Fabien, Nolot, Florent

Journal:

Procedia Computer Science

Year:

2020

File:

PDF, 285 KB

2020

15

Germanium, antimony, tellurium, their binary and ternary alloys and the impact of nitrogen: An X-ray photoelectron study

Nolot, E., Sabbione, C., Pessoa, W., Prazakova, L., Navarro, G.

Journal:

Applied Surface Science

Year:

2021

File:

PDF, 11.21 MB

2021

16

Shock response spectrum analysis in running performance

Benjamin, D., Odof, S., Abbes, B., Nolot, J.B., Erre, D., Fourchet, F., Taiar, R.

Journal:

Computer Methods in Biomechanics & Biomedical Engineering

Year:

2020

File:

PDF, 748 KB

2020

17

Multiple myeloma patients receiving large volume leukapheresis efficiently yield enough CD34+ cells to allow double transplants

A.C. Zubair, R. Rymer, J. Young, U. Keeton, R. Befort, B. Nolot, C. Evans, T. Bleach, A. Torloni

Journal:

Journal of Clinical Apheresis

Year:

2009

Language:

english

File:

PDF, 147 KB

english, 2009

18

Characterization of CMOS sub-65 nm metallic contact by laser scattering: Thermal stability of Ni(Si1−xGex)

B. Arrazat, A. Danel, E. Nolot, S. Favier, V. Carron, F. Nemouchi, J.M. Hartmann, G. Rolland, P. Vandelle, O. Kermarrec, Y. Campidelli, S. Descombes

Journal:

Microelectronic Engineering

Year:

2007

Language:

english

File:

PDF, 522 KB

english, 2007

19

Thin film characterization by total reflection x-ray fluorescence

Adrien Danel, Emmanuel Nolot, Marc Veillerot, Ségolène Olivier, Tifenn Decorps, Maria-Luisa Calvo-Muñoz, Jean-Michel Hartmann, Sandrine Lhostis, Hiroshi Kohno, Motoyuki Yamagami, Charles Geoffroy

Journal:

Spectrochimica Acta Part B: Atomic Spectroscopy

Year:

2008

Language:

english

File:

PDF, 585 KB

english, 2008

20

Ellipsometry characterization of bulk acoustic wave filters

E. Nolot, A. Lefevre, J. N. Hilfiker

Journal:

physica status solidi (c)

Year:

2008

Language:

english

File:

PDF, 425 KB

english, 2008

21

Statistical characterization of acceleration levels of random vibrations during transport

S. Otari, S. Odof, J. B. Nolot, P. Vasseur, J. Pellot, N. Krajka, D. Erre

Journal:

Packaging Technology and Science

Year:

2011

Language:

english

File:

PDF, 757 KB

english, 2011

22

Changes in the concept of genotype

D. Desclaux, J. M. Nolot, Y. Chiffoleau, E. Gozé, C. Leclerc

Journal:

Year:

2008

Language:

english

File:

PDF, 255 KB

english, 2008

23

Applications of X-Ray Characterization for Advanced Materials in the Electronics Industry

A. Vigliante, N. Kasper, J. Brechbuehl, E. Nolot

Journal:

Metallurgical and Materials Transactions A

Year:

2010

Language:

english

File:

PDF, 549 KB

english, 2010

24

Iterative design and evaluation of rule-based cropping systems: methodology and case studies. A review

Philippe Debaeke, Nicolas Munier-Jolain, Michel Bertrand, Laurence Guichard, Jean-Marie Nolot, Vincent Faloya, Patrick Saulas

Journal:

Agronomy for Sustainable Development

Year:

2009

Language:

english

File:

PDF, 272 KB

english, 2009

25

Phosphorus management in low input stockless cropping systems: Crop and soil responses to contrasting P regimes in a 36-year experiment in southern France

B. Colomb, P. Debaeke, C. Jouany, J.M. Nolot

Journal:

European Journal of Agronomy

Year:

2007

Language:

english

File:

PDF, 790 KB

english, 2007

26

[IEEE 2009 Fifth International Conference on Wireless and Mobile Communications - Cannes/La Bocca, France (2009.08.23-2009.08.29)] 2009 Fifth International Conference on Wireless and Mobile Communications - Self-Stabilizing Clustering Algorithm for Ad Hoc Networks

Flauzac, Olivier, Haggar, Bachar Salim, Nolot, Florent

Year:

2009

Language:

english

File:

PDF, 235 KB

english, 2009

27

A rule-based method for the development of crop management systems applied to grain sorghum in south-western France

Philippe Debaeke, Jean-Marie Nolot, Didier Raffaillac

Journal:

Agricultural Systems

Year:

2006

Language:

english

File:

PDF, 322 KB

english, 2006

28

[ACM Press the 7th International Conference - Kota Kinabalu, Malaysia (2013.01.17-2013.01.19)] Proceedings of the 7th International Conference on Ubiquitous Information Management and Communication - ICUIMC '13 - Self-stabilizing k-hops clustering algorithm for wireless ad hoc networks

Ba, Mandicou, Flauzac, Olivier, Haggar, Bachar Salim, Nolot, Florent, Niang, Ibrahima

Year:

2013

Language:

english

File:

PDF, 427 KB

english, 2013

29

[IEEE 2001 IEEE International Performance, Computing, and Communications Conference - Phoenix, AZ, USA (4-6 April 2001)] Conference Proceedings of the 2001 IEEE International Performance, Computing, and Communications Conference (Cat. No.01CH37210) - Universal self-stabilizing phase clock protocol with bounded memory

Nolot, F., Villain, V.

Year:

2001

Language:

english

File:

PDF, 577 KB

english, 2001

30

[IEEE 2009 Third International Conference on Network and System Security - Gold Coast, Queensland, Australia (2009.10.19-2009.10.21)] 2009 Third International Conference on Network and System Security - Grid of Security: A New Approach of the Network Security

Flauzac, Olivier, Nolot, Florent, Rabat, Cyril, Steffenel, Luiz-Angelo

Year:

2009

Language:

english

File:

PDF, 920 KB

english, 2009

31

[IEEE 2013 Global Information Infrastructure Symposium - Trento, Italy (2013.10.28-2013.10.31)] Global Information Infrastructure Symposium - GIIS 2013 - PriBaCC: In-network sensor data processing for efficient smart grid monitoring applications

Matta, Natalie, Rahim-Amoud, Rana, Merghem-Boulahia, Leila, Jrad, Akil, Nolot, Florent

Year:

2013

Language:

english

File:

PDF, 178 KB

english, 2013

32

[IEEE 2010 10th Annual International Conference on New Technologies of Distributed Systems (NOTERE) - Tozeur, Tunisia (2010.05.31-2010.06.2)] 2010 10th Annual International Conference on New Technologies of Distributed Systems (NOTERE) - Tree and cluster management for MANET

Flauzac, Olivier, Haggar, Bachar Salim, Nolot, Florent

Year:

2010

Language:

english

File:

PDF, 162 KB

english, 2010

33

[IEEE 2009 IEEE International SOI Conference - Foster City, CA, USA (2009.10.5-2009.10.8)] 2009 IEEE International SOI Conference - Engineering silicon-on-insulator (SOI) substrates for hybrid orientation technologies (HOT)

Signamarcheix, T., Biasse, B., Papon, A-M., Nolot, E., Ghyselen, B., Clavelier, L.

Year:

2009

Language:

english

File:

PDF, 589 KB

english, 2009

34

Improvement of Capacitive Behavior on Gradient-Free PZT Thin Films

Pelloquin, Sylvain, Le Rhun, Gwenael, Defaÿ, Emmanuel, Renaux, Philippe, Nolot, Emmanuel, Abergel, Julie, Sibuet, Henri

Journal:

Integrated Ferroelectrics

Year:

2014

Language:

english

File:

PDF, 437 KB

english, 2014

35

Thin film analysis by low-energy ion scattering by use of TRBS simulations

Brüner, Philipp, Grehl, Thomas, Brongersma, Hidde, Detlefs, Blanka, Nolot, Emmanuel, Grampeix, Helen, Steinbauer, Erich, Bauer, Peter

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2015

Language:

english

File:

PDF, 1.33 MB

english, 2015

36

Crystallographic orientation engineering in silicon-on-insulator substrates

Signamarcheix, T., Biasse, B., Papon, A.-M., Nolot, E., Mazen, F., Leveneur, J., Faynot, O., Clavelier, L., Ghyselen, B.

Journal:

Applied Physics Letters

Year:

2010

Language:

english

File:

PDF, 903 KB

english, 2010

37

[IEEE 2006 International SiGe Technology and Device Meeting - Princeton, NJ, USA ()] 2006 International SiGe Technology and Device Meeting - Fabrication of SiGe-On-Insulator by Improved Ge Condensation Technique

Damlencourt, J.F., Vincent, B., Rivallin, P., Holliger, P., Rouchon, D., Nolot, E., Licitra, C., Morand, Y., Clavelier, L., Billon, T.

Year:

2006

Language:

english

File:

PDF, 1.71 MB

english, 2006

38

[IEEE 12th European Quantum Electronics Conference CLEO EUROPE/EQEC - Munich, Germany (2011.05.22-2011.05.26)] 2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference (CLEO EUROPE/EQEC) - Integrated optics beam combiner at 2.2µm for astronomical interferometers

Labeye, Pierre, Nolot, Axelle, Lardenois, Sebastien, Oliver, Steve, Jocou, Laurent, Perraut, Karine, Berger, Jean-Philippe, Eisenhauer, Frank

Year:

2011

Language:

english

File:

PDF, 253 KB

english, 2011

39

200 mm Silicon On Porous Layer Substrates Made by the Smart Cut Technology for Double Layer-Transfer Applications

Stragier, A.-S., Signamarcheix, T., Salvetat, T., Nolot, E., Dechamp, J., Mercier, D., Gergaud, P., Tauzin, A., Clavelier, L., Lemiti, M.

Journal:

Journal of The Electrochemical Society

Year:

2011

Language:

english

File:

PDF, 2.03 MB

english, 2011

40

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - 200 mm Silicon on Porous Layer Substrates Made by the Smart Cut Technology for Double Layer Transfer Applications

Stragier, Anne-Sophie, Signamarcheix, Thomas, Salvetat, Thierry, Nolot, Emmanuel, Dechamp, Jero^me, Mercier, David, Gergaud, Patrice, Tauzin, Aurélie, Clavelier, Laurent, Lemiti, Mustapha

Year:

2010

Language:

english

File:

PDF, 721 KB

english, 2010

41

New Security Architecture for IoT Network

Olivier, Flauzac, Carlos, Gonzalez, Florent, Nolot

Journal:

Procedia Computer Science

Year:

2015

Language:

english

File:

PDF, 445 KB

english, 2015

42

Optical Constants Determination of Pseudomorphic Si1-XGex Layers on Si(001), with 0

Nolot, E., Hartmann, J.-M., Hilfiker, J.

Journal:

ECS Transactions

Year:

2014

Language:

english

File:

PDF, 1.40 MB

english, 2014

43

A multiple random walks based self-stabilizing k -exclusion algorithm in ad hoc networks

Bernard, Thibault, Bui, Alain, Flauzac, Olivier, Nolot, Florent

Journal:

International Journal of Parallel Emergent and Distributed Systems

Year:

2010

Language:

english

File:

PDF, 286 KB

english, 2010

44

Optimal transport maps on infinite dimensional spaces

Fang, Shizan, Nolot, Vincent

Journal:

Frontiers of Mathematics in China

Year:

2015

Language:

english

File:

PDF, 213 KB

english, 2015

45

[AIP CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY 2005 - Richardson, Texas (USA) (15-18 March 2005)] AIP Conference Proceedings - Practical Applications of XRR-XRF Metrology Tool

Nolot, Emmanuel

Year:

2005

Language:

english

File:

PDF, 297 KB

english, 2005

46

[AIP CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology - Gaithersburg, MD (27-29 March 2007)] AIP Conference Proceedings - Thin Films Characterization by Ultra Trace Metrology

Danel, A., Nolot, E., Lhostis, S., Campidelli, Y., Calvo-Muñoz, M.-L., Decorps, T., Lardin, T., Veillerot, M., Kohno, H., Yamagami, M., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner,

Year:

2007

Language:

english

File:

PDF, 584 KB

english, 2007

47

[AIP CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology - Gaithersburg, MD (27-29 March 2007)] AIP Conference Proceedings - Applications of X-Ray Reflectometry to Develop and Monitor FEOL Processes for sub-45nm Technology Nodes

Nolot, E., Bogumilowicz, Y., Lhostis, S., Danel, A., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

Year:

2007

File:

PDF, 2.24 MB

2007

48

[AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009 - Albany (New York) (11–15 May 2009)] AIP Conference Proceedings - Evaluation of experimental techniques for In-line Ion Implantation Characterization

Vignoud, L., Milesi, F., Nolot, E., Danel, A., Favier, S., Secula, Erik M., Seiler, David G., Khosla, Rajinder P., Herr, Dan, Michael Garner, C., McDonald, Robert, Diebold, Alain C.

Year:

2009

Language:

english

File:

PDF, 919 KB

english, 2009

49

Fabrication of SiGe-on-insulator substrates by a condensation technique: an experimental and modelling study

Vincent, B, Damlencourt, J-F, Rivallin, P, Nolot, E, Licitra, C, Morand, Y, Clavelier, L

Journal:

Semiconductor Science and Technology

Year:

2007

Language:

english

File:

PDF, 647 KB

english, 2007

50

[IEEE 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2015.5.3-2015.5.6)] 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Optical properties determination of Fully Depleted Silicon On Insulator (FDSOI) substrates by ellipsometry

Schneider, L., Abbate, F., Le Cunff, D., Nolot, E., Michallet, A.

Year:

2015

Language:

english

File:

PDF, 322 KB

english, 2015